Welcome to the CROSSTALK - the IEEE EMC Society Podcast. Hear us above the Noise!
The Podcast to discuss interesting topics on electromagnetic compatibility to our technical community.

In this issue we will talk with Si-Ping Gao .Siping is research fellow at the National University of Singapore and focusing on his research on computational electromagnetics, EMC, SI/PI for high-speed electronics, and microwave measurement over temperature. And that´s what we will be talking about: Microwave Measurement over Temperature.

Please see below for the references:

1. S. -P. Gao, I. Cherukhin and Y. Guo, "Characterizing Microwave Connectors Over Temperature: Thermal-Stable Standards and Characterization Method," in IEEE Transactions on Microwave Theory and Techniques, 70(2), 1078–1086, Feb. 2022.
2. S. -P. Gao and W. Cong, "A Novel Waveguide-Based Test Kit for Material Characterization Over Temperature," 2021 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP), 2021, pp. 403-405.
3. S. -P. Gao and I. Cherukhin, "Measurement Considerations for Accurately Characterizing the Constitutive Material Parameters," 2020 International Conference on Microwave and Millimeter Wave Technology (ICMMT), 2020, pp. 1-3.
4. S. -P. Gao and I. Cherukhin, "Characterizing Microwave Connectors over Temperatures Using Thermal-stable Standards," 2020 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP), 2020, pp. 1-3

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