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2026 FEM in S-SNOM
Talks about 3 papers:
F. Mooshammer, M. A. Huber, F. Sandner, M. Plankl, M. Zizlsperger, and R. Huber, "Quantifying Nanoscale Electromagnetic Fields in Near-Field Microscopy by Fourier Demodulation Analysis," ACS Photonics 7(2), 344–351 (2020).
C. Maissen, S. Chen, E. Nikulina, A. Govyadinov, and R. Hillenbrand, "Probes for Ultrasensitive THz Nanoscopy," ACS Photonics 6(5), 1279–1288 (2019).
S. Mastel, A. A. Govyadinov, C. Maissen, A. Chuvilin, A. Berger, and R. Hillenbrand, "Understanding the Image Contrast of Material Boundaries in IR Nanoscopy Reaching 5 nm Spatial Resolution," ACS Photonics 5(8), 3372–3378 (2018).
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By RayZTalks about 3 papers:
F. Mooshammer, M. A. Huber, F. Sandner, M. Plankl, M. Zizlsperger, and R. Huber, "Quantifying Nanoscale Electromagnetic Fields in Near-Field Microscopy by Fourier Demodulation Analysis," ACS Photonics 7(2), 344–351 (2020).
C. Maissen, S. Chen, E. Nikulina, A. Govyadinov, and R. Hillenbrand, "Probes for Ultrasensitive THz Nanoscopy," ACS Photonics 6(5), 1279–1288 (2019).
S. Mastel, A. A. Govyadinov, C. Maissen, A. Chuvilin, A. Berger, and R. Hillenbrand, "Understanding the Image Contrast of Material Boundaries in IR Nanoscopy Reaching 5 nm Spatial Resolution," ACS Photonics 5(8), 3372–3378 (2018).