Micro Focus chief technologist on how AI, computer vision and NLP free testers to focus on what and why, not how.

Don Jackson traces his journey from customer to Micro Focus chief technologist and explores how computer vision and NLP in the UFT family let testers interact with applications visually rather than through the DOM or brittle selectors. He argues AI should recognize objects by their visual characteristics instead of self-healing, and previews next-generation model-based testing that underpins reusable components with any automation type plus risk-based metadata. He champions 'shift everywhere' and a fourth persona (leadership) who should see elevated value rather than scrape Jenkins logs. The conversation covers negative testing, test data generation, SAP package testing, service virtualization and the upcoming Universe event.

**In this episode:**

**Guest:** Don Jackson — Chief Technologist, Micro Focus  

> “Focus on what and why, not how. Let the tool take care of the how.”

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