Geoff Meyer, Test Architect and QA Thought Leader, from Dell EMC joins tap|TALK to discuss Artificial Intelligence and Machine Learning, and how it is impacting QA and Test Automation, as well as Software Development as a whole. Geoff spoke on these topics as the Keynote Address at STAREAST 2018, and shares some great info on this edition of tap|TALK.
This is a great episode for QA Practitioners and Technology Leaders alike!