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Fred interviews Jim McLinn about the annual ASTR conference.
Sponsored by IEEE Reliability Society and ASQ Reliability Division
www.ieee-astr.org
The 2017 Accelerated Stress Testing and Reliability (ASTR) Conference is focused on highlighting cutting-edge methods to deliver maximum cost-benefits from accelerated reliability testing. ASTR 2017 is relevant to product development, test and manufacturers involved in the aerospace, automotive, consumer electronics, defense, biomedical, telecommunications, software and other leading industries where reliability is a key driver of operational and business success. ASTR 2017 will present detailed case studies, best practices, lessons learned, and clear insight on how to best apply and integrate accelerated testing tools and methods.
Students welcome to present research.
Become part of this active, growing conference sponsored by both the ASQ-Reliability Division and the IEEE- Reliability Society. The hotel has special rates for this conference.
There are many reasons to attend this conference! Make this your fall destination:
Learn new Hardware and Software techniques
Understand Accelerated Test
Develop Better Life Test plans
Robustness Testing
Don't Miss this conference. There will be speakers from many countries. Check the Website now for the tentative program topics and speakers. See www.ieee-astr.org
Recorded January 2017.
www.ieee-astr.org
The post DTK Jim McLinn ASTR Conference appeared first on Accendo Reliability.
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Fred interviews Jim McLinn about the annual ASTR conference.
Sponsored by IEEE Reliability Society and ASQ Reliability Division
www.ieee-astr.org
The 2017 Accelerated Stress Testing and Reliability (ASTR) Conference is focused on highlighting cutting-edge methods to deliver maximum cost-benefits from accelerated reliability testing. ASTR 2017 is relevant to product development, test and manufacturers involved in the aerospace, automotive, consumer electronics, defense, biomedical, telecommunications, software and other leading industries where reliability is a key driver of operational and business success. ASTR 2017 will present detailed case studies, best practices, lessons learned, and clear insight on how to best apply and integrate accelerated testing tools and methods.
Students welcome to present research.
Become part of this active, growing conference sponsored by both the ASQ-Reliability Division and the IEEE- Reliability Society. The hotel has special rates for this conference.
There are many reasons to attend this conference! Make this your fall destination:
Learn new Hardware and Software techniques
Understand Accelerated Test
Develop Better Life Test plans
Robustness Testing
Don't Miss this conference. There will be speakers from many countries. Check the Website now for the tentative program topics and speakers. See www.ieee-astr.org
Recorded January 2017.
www.ieee-astr.org
The post DTK Jim McLinn ASTR Conference appeared first on Accendo Reliability.