Intel

Faster, More Accurate Defect Classification Using Machine Vision


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IT Best Practices: Automated defect classification (ADC) using machine vision (MV) and machine learning (ML) can improve speed, consistency, and efficiency in manufacturing processes. [See the full post…] Related Posts:Microsoft Azure Machine Learning and Project Brainwave – Intel Chip Chat – Episode 610Data Mining: Machine Learning for Customer InsightAccelerating AI Inference with Microsoft Azure Machine Learning – Intel Chip…Increasing Product Quality and Yield Using Machine LearningThe Quest for Machine Learning’s Master Algorithm – Intel Chip Chat…
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IntelBy Intel

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