Understanding Semiconductors: Modern Metrology from Lab to Fab

Increased Metrology Means Increased Data. So what Do We Do With It? w/ Alex Liddle - Scientific Director at NIST


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The National Institute of Standards and Technology (NIST) is a physical sciences laboratory and non-regulatory agency of the United States Department of Commerce. NIST's activities are organized into laboratory programs that include nanoscale science and technology, engineering, information technology, neutron research, material measurement, and physical measurement.
In today’s episode Markus speaks with Alex Liddle, Scientific Director at NIST.
They discuss:
Alex’s Career Journey to NIST
Dimensional Metrology
The Measurement of a Test Structure vs. the Actual Structure and CoverageThe trend to measure everything you can across the wafer

Key Trends Alex noticed at this years Frontiers conference
Stochastic Failures, Lithography and Reliability 


Reach out to Markus for any potential guest requests or episode ideas here: https://www.linkedin.com/in/markus-kuhn-4b502110/
For the latest in new Metrology Techniques and Solutions check out https://rsmd.rigaku.com/
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Understanding Semiconductors: Modern Metrology from Lab to FabBy Rigaku

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