In this episode of GaN Talk Podcast, host Maurizio Di Paolo Emilio speaks with Shengke Zhang, Vice President of Reliability at Efficient Power Conversion (EPC), about the newly released Phase 18 GaN reliability report. They explore why traditional silicon-style qualification is no longer enough, the importance of test‑to‑fail methodologies, and the critical role of thermo‑mechanical and power‑cycling stress. If you design high‑reliability power systems - from data centers to humanoid robots - this conversation is packed with practical reliability insight.