Tim interviews Nihal Sinnadurai an engineer and organizer of the 1st and 2nd Foundation program.

Professor Doctor Nihal Sinnadurai is the CEO and Chief Technologist of Advanced Technology Transfer Associates, Chair of IEEE's Action for Industry and past Chair of IEEE UK and Ireland. He was formerly Global VP of Reliability and Quality and Corporate Director at Bookham (now Oclaro). He received the 2015 Lifetime Achievement Award by the IEEE Reliability Society, and the 2011 International Award and 2003 Outstanding Achievement Award by the International Microelectronics Society.

Dr. Sinnadurai's innovations include the deployment of low-cost microelectronics in high-reliability communications systems, inventing HAST in 1968 while at British Telecom Research Labs, and establishing the correct methodology for its use, and inventing Liquid Crystal Micro-Thermography for microelectronics.

In this episode, Rick and Tim discuss:

Recorded November 2016.

Here is a slideset Nihal used to present to IEEE SERE in June of 2013 that outlines the issues lurking by not completing a proper reliability analysis.

Ticking Time-Bombs in Electronics and Photonics Systems and Networks & Mitigation thereof

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