This week on Tech Corner we look at the JEOL NeoScope (JCM-7000) scanning electron microscope from Nikon Metrology. Auto functions, stage automation, and software enable easy sample imaging and elemental analysis.
This week on Tech Corner we look at the JEOL NeoScope (JCM-7000) scanning electron microscope from Nikon Metrology. Auto functions, stage automation, and software enable easy sample imaging and elemental analysis.