USB 3.2 doubles the data rate of previous USB specs, but makes the testing process significantly harder. Find out why in this electrical engineering podcast.

The Huge Challenge of Testing USB 3.2 – #33

Inspired by over-the-cubical-wall conversations about the changing world of electrical and electronics engineering, Daniel Bogdanoff and Mike Hoffman set out to create an electrical engineering podcast. Covering a broad range of topics from the basics of electrical engineering to the tough engineering problems of tomorrow’s technologies, Daniel & Mike bring in members of Keysight’s engineering team to provide their unique perspectives.

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Inspired by over-the-cubical-wall conversations about the changing world of electrical and electronics engineering, Daniel Bogdanoff and Mike Hoffman set out to create an electrical engineering podcast. Covering a broad range of topics from the basics of electrical engineering to the tough engineering problems of tomorrow’s technologies, Daniel &amp; Mike bring in members of Keysight’s engineering team to provide their unique perspectives.

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The Huge Challenge of Testing USB 3.2 – #33

The Huge Challenge of Testing USB 3.2 – #33