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Three-Dimensional Cell Model Enhances DNA Damage Testing
Superfund Research Program Center scientists developed a new platform, known as the SpheroidChip analysis method, to rapidly test for DNA damage in three-dimensional cell models. Development was led by Bevin Engelward, Sc.D., at the Massachusetts Institute of Technology.
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By NIEHS Superfund Research Program
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Superfund Research Program Center scientists developed a new platform, known as the SpheroidChip analysis method, to rapidly test for DNA damage in three-dimensional cell models. Development was led by Bevin Engelward, Sc.D., at the Massachusetts Institute of Technology.