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ViTrox improve defect detection in their inspection systems
Zi Yang Seow describes how ViTrox have intelligently improved the SPI, AOI and X-ray inspection systems to overlay each inspection technique to provide a holistic view of any defects.
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By Global SMT & PackagingZi Yang Seow describes how ViTrox have intelligently improved the SPI, AOI and X-ray inspection systems to overlay each inspection technique to provide a holistic view of any defects.