Patent Bar MPEP Q & A Podcast

MPEP Q & A 290: Use of metric system of measurements in patent applications


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Question: How should measurements be given within a patent application? Answer: In order to minimize the necessity in the future for converting dimensions given in the English system of measurements to the metric system of measurements when using printed patents as research and prior art search documents, all patent applicants should use the metric (S.I.) […]

The post MPEP Q & A 290: Use of metric system of measurements in patent applications appeared first on Patent Education Series.

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Patent Bar MPEP Q & A PodcastBy Lisa Parmley, USPTO Patent Practitioner #51006

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