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Question: How should measurements be given within a patent application? Answer: In order to minimize the necessity in the future for converting dimensions given in the English system of measurements to the metric system of measurements when using printed patents as research and prior art search documents, all patent applicants should use the metric (S.I.) […]
The post MPEP Q & A 290: Use of metric system of measurements in patent applications appeared first on Patent Education Series.
 By Lisa Parmley, USPTO Patent Practitioner #51006
By Lisa Parmley, USPTO Patent Practitioner #510063.9
1212 ratings
Question: How should measurements be given within a patent application? Answer: In order to minimize the necessity in the future for converting dimensions given in the English system of measurements to the metric system of measurements when using printed patents as research and prior art search documents, all patent applicants should use the metric (S.I.) […]
The post MPEP Q & A 290: Use of metric system of measurements in patent applications appeared first on Patent Education Series.

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