July 27, 2020

Dealing with False Positives or False Negatives

Abstract

Kirk and Fred discussing when to act on improvement of reliability from testing, HALT results, or change in field failure rates

Key Points

Join Kirk and Fred as they discuss testing and dealing with the information derived from HALT and consider them a false reason to improve product robustness.

Topics include:

Sample size is critical to determining whether a weakness found in HALT requires comparing limits between sample units or from HALT of predecessor products.

Rate of change in the field failure rate of a product in production is the critical to determine if a new latent defect or application needs investigation.

How do we set trigger levels for acting on an increase in failure rates from testing or the field?

Enjoy an episode of Speaking of Reliability. Where you can join friends as they discuss reliability topics. Join us as we discuss topics ranging from design for reliability techniques to field data analysis approaches.

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Show Notes

Here is a link to Kirk’s book co-authored with John J. Paschkewitz available from Amazon “Next Generation HALT and HASS: Robust Design of Electronics and Systems”

Here is the link to the US ARMY/CALCE PAPER presented at the 2013 RAMS conference event mentioned in this podcast– “Reliability Prediction – A Continued Reliance on a Misleading Approach” . This is a government document that is in the public domain and should be distributed a read by any engineer that believes failure prediction methodology is useful or beneficial during product development.

The post SOR 569 Dealing with False Positives or False Negatives appeared first on Accendo Reliability.

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July 27, 2020

Dealing with False Positives or False Negatives

Abstract

Kirk and Fred discussing when to act on improvement of reliability from testing, HALT results, or change in field failure rates

Key Points

Join Kirk and Fred as they discuss testing and dealing with the information derived from HALT and consider them a false reason to improve product robustness.

Topics include:

Sample size is critical to determining whether a weakness found in HALT requires comparing limits between sample units or from HALT of predecessor products.

Rate of change in the field failure rate of a product in production is the critical to determine if a new latent defect or application needs investigation.

How do we set trigger levels for acting on an increase in failure rates from testing or the field?

Download Audio RSS

Show Notes

Here is a link to Kirk’s book co-authored with John J. Paschkewitz available from Amazon “Next Generation HALT and HASS: Robust Design of Electronics and Systems”

The post SOR 569 Dealing with False Positives or False Negatives appeared first on Accendo Reliability.

...more