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Microwave Journal editors Pat Hindle and Del Pierson are joined by special guest Joe Dussi from Infineon Hi Rel to discuss the July AI, Software and Test issue articles, the satellite/space market and IMS 2025. Sponsored by RFMW.
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Microwave Journal editors Pat Hindle and Del Pierson are joined by special guest Joe Dussi from Infineon Hi Rel to discuss the July AI, Software and Test issue articles, the satellite/space market and IMS 2025. Sponsored by RFMW.
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