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History of VNAs Leading Up to 330 to 500 GHz Full Vector Component Test System
Microwave Journal editors Pat Hindle and Del Pierson explore the history of VNAs and other testing technologies at Keysight Technologies that lead up to development of a full vector component testing system at 330 to 500 GHz shown at IMS this year by talking with Joel Dunsmore, Research Fellow at Keysight Technologies.
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By microwavejournal
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Microwave Journal editors Pat Hindle and Del Pierson explore the history of VNAs and other testing technologies at Keysight Technologies that lead up to development of a full vector component testing system at 330 to 500 GHz shown at IMS this year by talking with Joel Dunsmore, Research Fellow at Keysight Technologies.
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