Microwave Journal Podcasts

Microwave Journal editors Pat Hindle and Del Pierson review the August EuMW and mmWave themed issue articles along with the latest industry news and events. Sponsored by RFMW.

Pat Hindle and Del Pierson talk with Juan Montojo, VP of Technical Standards and Qualcomm's 3GPP lead, about 3GPP Release 20 including the overall goals and technologies that will be covered and the timing of the release.

Microwave Journal editors Pat Hindle and Del Pierson review the July issue articles, interview TMYTEK about reconfigurable intelligent surfaces technology and cover industry news and events. Sponsored by RFMW and TMYTEK.

Microwave Journal editors Pat Hindle and Del Pierson are joined by special guest Joe Dussi from Infineon Hi Rel to discuss the July AI, Software and Test issue articles, the satellite/space market and IMS 2025. Sponsored by RFMW.

Microwave Journal editors, Pat Hindle and Del Pierson, talk with Robert Heath, an IEEE Fellow, Charles Lee Powell Chair, Wireless Communications at UCSD, and recent recipient of the IEEE/RSE James Clerk Maxwell Medal. They discuss Robert's contributions to MIMO technology and future trends in wireless technology.

Pat Hindle and Del Pierson talk with Rob Smith, Vice President, Radio Frequency Solutions at Raytheon, the new PhantomStrike radar,  a lightweight, affordable, compact radar for any platform that is about half the weight and cost of traditional AESA radar systems. It is aimed at SWAP challenged platforms such as UAVs, rotary wing aircraft or lightweight/training fighters.

Microwave Journal editors Pat Hindle and Del Pierson cover the June Aerospace and Defense supplement articles/products, industry news and IMS 2025. Sponsored by Mini-Circuits.

Microwave Journal editors Pat Hindle and Del Pierson cover the June Semiconductor/RFIC themed issue articles, Industry News and IMS 2025. Sponsored by RFMW.

Irena Goloschokin, CEO of Copper Mountain Technologies, talks with Pat Hindle about separating their operations from Russia and onshoring their operations along with their strategy to innovate VNA products for the test/measurement market.

Wolfgang Wendler, Product Manager, and Darren Tipton, Director of Product Management, at Rohde & Schwarz talk with Pat Hindle and Del Pierson about the challenges facing signal and spectrum analysis instruments and some solutions to solve emerging measurement problems for various applications. To find out more about this new product development, visit R&S here.