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With IoT and Industry 4.0 being the omnipresent new paradigm in manufacturing, increasing the speed, amount, and accuracy of data generation is a critical necessity. Solutions the integrate metrology data should dramatically increase productivity, reduce errors, provide full documentation and automate the acquisition process. Bruce Morey, Senior Technical Editor for Manufacturing Engineering Magazine discusses all this with Jeff Wilkinson. He is the Director of Research & Development at The L. S. Starrett Co. Click here to learn more.
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With IoT and Industry 4.0 being the omnipresent new paradigm in manufacturing, increasing the speed, amount, and accuracy of data generation is a critical necessity. Solutions the integrate metrology data should dramatically increase productivity, reduce errors, provide full documentation and automate the acquisition process. Bruce Morey, Senior Technical Editor for Manufacturing Engineering Magazine discusses all this with Jeff Wilkinson. He is the Director of Research & Development at The L. S. Starrett Co. Click here to learn more.
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